Manufacturer Part Number
IPG20N06S4L14AATMA1
Manufacturer
Infineon Technologies
Introduction
This product is a discrete semiconductor device, specifically a Transistor - FET, MOSFET - Array, from Infineon Technologies.
Product Features and Performance
2 N-Channel (Dual) MOSFET configuration
60V Drain to Source Voltage (Vdss)
7mOhm maximum On-Resistance (Rds(on)) @ 17A, 10V
20A maximum Continuous Drain Current (Id) @ 25°C
2890pF maximum Input Capacitance (Ciss) @ 25V
2V maximum Gate-Source Threshold Voltage (Vgs(th)) @ 20A
39nC maximum Gate Charge (Qg) @ 10V
Wide operating temperature range of -55°C to 175°C (TJ)
50W maximum Power rating
Product Advantages
Automotive-grade, AEC-Q101 qualified
OptiMOS technology for improved efficiency and performance
Logic Level Gate for easy driving
Key Technical Parameters
Drain to Source Voltage (Vdss): 60V
On-Resistance (Rds(on)): 13.7mOhm @ 17A, 10V
Continuous Drain Current (Id): 20A @ 25°C
Input Capacitance (Ciss): 2890pF @ 25V
Gate-Source Threshold Voltage (Vgs(th)): 2.2V @ 20A
Gate Charge (Qg): 39nC @ 10V
Operating Temperature Range: -55°C to 175°C (TJ)
Power Rating: 50W
Quality and Safety Features
ROHS3 compliant
Automotive-grade, AEC-Q101 qualified
Compatibility
This product is suitable for a wide range of applications that require high-performance, automotive-grade power MOSFETs.
Application Areas
Automotive electronics
Industrial and power electronics
Switch-mode power supplies
Motor control
Battery management systems
Product Lifecycle
This product is currently in production and available for purchase. There are no known plans for discontinuation or replacement at this time.
Key Reasons to Choose This Product
Automotive-grade and AEC-Q101 qualified for reliable performance in harsh environments
OptiMOS technology for improved efficiency and thermal management
Logic Level Gate for easy driving and integration
Wide operating temperature range suitable for diverse applications
Compact 8-PowerVDFN package for space-constrained designs
Robust construction and quality control for long-term reliability