Manufacturer Part Number
L6386ED013TR
Manufacturer
stmicroelectronics
Introduction
The L6386ED013TR is a high-performance gate driver designed for power management applications, specifically suited to drive half-bridge circuits composed of IGBTs and N-Channel MOSFETs.
Product Features and Performance
Supports half-bridge driven configuration
Controls independent channels
Capable of driving IGBT and N-Channel MOSFET gate types
Maximum supply voltage of 17V
Logic voltage levels of 1.5V (VIL) and 3.6V (VIH)
Peak output currents of 400mA (source) and 650mA (sink)
Inverting input type
High side voltage capability up to 600V (bootstrap)
Rise and fall times are 50ns and 30ns respectively
Operational over a temperature range of -40°C to 150°C
Product Advantages
The L6386ED013TR offers enhanced switching performance and robustness for high-reliability power management systems.
Key Technical Parameters
Driven Configuration: Half-Bridge
Number of Drivers: 2
Voltage - Supply: 17V (Max)
Current - Peak Output (Source, Sink): 400mA, 650mA
High Side Voltage - Max (Bootstrap): 600V
Rise / Fall Time (Typ): 50ns, 30ns
Operating Temperature: -40°C to 150°C
Quality and Safety Features
Built to withstand high voltage and current levels with enhanced thermal management properties ensuring reliable operation across diverse environmental conditions.
Compatibility
Compatible with various IGBTs and N-Channel MOSFETs configurations, enhancing its adaptability in multiple gate-driving applications.
Application Areas
Utilized in power management systems, including but not limited to converters, inverters, motor control systems, and power supply units.
Product Lifecycle
This product is currently active with ongoing support and availability. There are no current indications of discontinuation, and replacements or upgrades are available as technological advancements occur.
Several Key Reasons to Choose This Product
High voltage and current driving capabilities ensure suitability for robust power applications.
Rapid switching with precise rise and fall times improve system efficiency.
Operational reliability across a wide temperature range caters to demanding environments.
Compatibility with a broad range of power semiconductor devices allows flexible design options.
Extended product lifecycle with support ensures long-term deployment viability.