Manufacturer Part Number
BQ4013YMA-85N
Manufacturer
Texas Instruments
Introduction
BQ4013YMA-85N is a Non-Volatile SRAM component designed for high-speed memory storage applications, offering long-term data retention without the need for a battery.
Product Features and Performance
Non-Volatile SRAM (NVSRAM) technology
High memory density with 1Mbit storage capacity
Organized as 128K x 8 for efficient data management
Parallel memory interface for quick data access and handling
Write Cycle Time and Access Time of 85ns for rapid read/write operations
Through Hole Mounting Type for stable PCB installation
Product Advantages
Retains data without power due to non-volatile nature
Rapid access and write times enhance overall system performance
Resistance to mechanical shock, extending product reliability
Tolerant to a wide range of supply voltages (4.5V ~ 5.5V)
Operational across extreme temperatures (-40°C ~ 85°C)
Key Technical Parameters
Memory Size: 1Mbit
Memory Format: NVSRAM
Voltage - Supply: 4.5V ~ 5.5V
Operating Temperature: -40°C ~ 85°C
Access Time: 85 ns
Mounting Type: Through Hole
Package / Case: 32-DIP Module
Quality and Safety Features
Robust design tolerating wide temperature variations
Stringent manufacturing processes from Texas Instruments ensure high reliability
Compliant with industry safety and quality standards
Compatibility
Compatible with various microcontrollers and processors that support parallel memory interfaces
Application Areas
Industrial control systems
Automotive electronics
Data logging units
Network and communication infrastructure
Product Lifecycle
Obsolete status, alternative solutions or upgrades may be required
Potential discontinuation with limited stock availability
Key Reasons to Choose This Product
Reliable non-volatile data storage solution from a reputable manufacturer
Adequate memory size for various complex applications
Fast access and writing speeds improve system efficiency
Broad operating temperature range suits challenging environmental conditions
Trusted Texas Instruments quality for critical applications
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