Manufacturer Part Number
SN74BCT8240ADW
Manufacturer
Texas Instruments
Introduction
The SN74BCT8240ADW is a high-performance, 8-bit Scan Test Device with Inverting Buffers. It is designed for use in a wide range of digital electronic applications, offering reliable and efficient data transmission and signal processing capabilities.
Product Features and Performance
8-bit Scan Test Device with Inverting Buffers
Supports operating voltages from 4.5V to 5.5V
Operates within a temperature range of 0°C to 70°C
Surface mount packaging in a 24-SOIC (0.295", 7.50mm Width) format
Provides high-speed, low-power operation for demanding applications
Product Advantages
Efficient data transmission and signal processing
Reliable and robust performance
Versatile compatibility with various digital systems
Compact surface mount package for space-constrained designs
Key Reasons to Choose This Product
Proven reliability and performance from a trusted manufacturer
Optimized for power-sensitive applications
Flexible compatibility with a wide range of digital electronics
Cost-effective solution for 8-bit Scan Test Device requirements
Quality and Safety Features
Rigorously tested for consistent quality and reliability
Complies with industry safety standards for electronic components
Compatibility
Compatible with a variety of digital systems and platforms
Application Areas
Suitable for a wide range of digital electronic applications, including, but not limited to, industrial automation, telecommunications, and consumer electronics
Product Lifecycle
["The SN74BCT8240ADW is an active product, currently in production.","There may be equivalent or alternative models available from Texas Instruments. It is recommended to contact our website's sales team for the most up-to-date information on product availability and potential alternatives."]