SN74BCT8240ADWR - Texas Instruments

Manufacturer Part Number

SN74BCT8240ADWR

Manufacturer

Texas Instruments

Introduction

The SN74BCT8240ADWR is a high-performance, high-speed, 8-bit scan test device with inverting buffers. It is designed for use in a variety of digital logic applications, offering advanced functionality and versatility.

Product Features and Performance

8-bit scan test device with inverting buffers

High-speed operation with propagation delays as low as 3.5 ns

Supports 4.5V to 5.5V supply voltage range

Operates over a temperature range of 0°C to 70°C

Surface mount 24-SOIC package

Compliant with various industry standards and regulations

Product Advantages

Optimal for high-speed digital logic circuits

Versatile design for a wide range of applications

Reliable performance and durability

Efficient power consumption

Key Reasons to Choose This Product

Proven reliability and performance from a trusted manufacturer

Seamless integration into various digital systems

Cost-effective solution for high-speed logic requirements

Compliance with industry standards for quality and safety

Quality and Safety Features

Rigorous quality control and testing processes

Compliance with industry safety and environmental regulations

Robust design for reliable long-term operation

Compatibility

Suitable for use in a variety of digital logic applications

Integrates seamlessly with other Texas Instruments components

Application Areas

Digital logic circuits

Telecommunications equipment

Industrial automation and control systems

Computer and networking equipment

Product Lifecycle

["This product is currently obsolete, meaning it is no longer in active production.","There may be equivalent or alternative models available from Texas Instruments or other manufacturers. Customers are advised to contact our website's sales team for more information on suitable replacement options."]