Manufacturer Part Number
SN74ABT18646PM
Manufacturer
Texas Instruments
Introduction
The SN74ABT18646PM is a highly versatile and programmable logic device from Texas Instruments. This 18-bit Scan Test Device with Transceivers and Registers offers a comprehensive set of features and capabilities, making it an ideal choice for a wide range of applications.
Product Features and Performance
18-bit Scan Test Device with Transceivers and Registers
Supports supply voltages ranging from 4.5V to 5.5V
Operating temperature range of -40°C to 85°C
Surface mount package (64-LQFP)
Programmable logic functionality for enhanced flexibility and customization
Product Advantages
Versatile and programmable design for diverse application requirements
Robust performance across a wide range of operating conditions
Compact surface mount package for efficient board space utilization
Seamless integration with other Texas Instruments components
Key Reasons to Choose This Product
Exceptional performance and reliability
Flexible programmability for customized solutions
Compatibility with a wide range of systems and applications
Trusted Texas Instruments brand and quality assurance
Quality and Safety Features
Rigorous quality control and testing procedures
Compliance with industry safety standards
Robust design for reliable and long-lasting operation
Compatibility
Compatible with a wide range of electronic systems and devices
Application Areas
Suitable for use in various electronic devices and systems, such as industrial automation, test and measurement equipment, and communication systems.
Product Lifecycle
The SN74ABT18646PM is an active and currently available product from Texas Instruments.
There are no direct equivalent or alternative models available at this time. If you have any further questions or require assistance, please contact our sales team through our website.