SN74ABT18245ADLR - Texas Instruments

Manufacturer Part Number

SN74ABT18245ADLR

Manufacturer

Texas Instruments

Introduction

The SN74ABT18245ADLR is a high-speed transceiver from Texas Instruments designed for bi-directional communication with scan test capabilities.

Product Features and Performance

18-bit bi-directional transceiver

Integrated scan test device conforming to IEEE Std 1149.1-1990

Bus hold on data inputs to eliminate the need for external pullup/pulldown resistors

Three-state outputs for bus-oriented applications

Latch-up performance exceeds 250 mA per JESD 17

Product Advantages

Optimized for signal integrity and minimal noise interference

Capable of withstanding heavy usage in industrial grade environments

Designed for easy implementation within a wide range of electronic applications

Key Technical Parameters

Supply Voltage: 4.5V ~ 5.5V

Number of Bits: 18 bits

Operating Temperature: -40°C ~ 85°C

Logic Type: Scan Test Device with Bus Transceivers

Output current: -32 mA / 64 mA

Quality and Safety Features

Ensures high reliability and functionality that meets industry standards

Robust electrostatic discharge (ESD) protection

Compatibility

Compatible with 5V CMOS logic levels

Interoperable with other logic families using level-shifting techniques

Application Areas

Telecommunication systems

Computing and data storage systems

Industrial control systems

Medical equipment

Product Lifecycle

Active status, currently in production

No known discontinuation announcement

Availability of replacements or upgrades should be monitored via Texas Instruments' product lifecycle resource

Several Key Reasons to Choose This Product

Proven Texas Instruments' quality and industry track record

The SN74ABT18245ADLR is suitable for interfacing between different voltage levels

Reliable operation in extended temperature ranges

The inclusion of scan test features simplifies testability in complex systems

High drive capability suited for driving heavy loads