Manufacturer Part Number
ADS6129IRGZT
Manufacturer
Texas Instruments
Introduction
High-speed 12-bit analog-to-digital converter
Product Features and Performance
12-bit resolution
250 MSPS sampling rate
Single differential input
LVDS and parallel data interfaces
Sample-and-Hold ADC configuration
1:1 ratio Sample/Hold to ADC
Single ADC channel
Pipelined architecture for high throughput
Selectable external or internal voltage reference
Product Advantages
Precision data conversion for high-speed applications
Dual data interface options for design flexibility
High sampling rate suitable for broadband communications
Integrated sample-and-hold reduces system complexity
Robust pipeline architecture ensures reliable data processing
Key Technical Parameters
Number of Bits: 12
Sampling Rate (Per Second): 250M
Number of Inputs: 1
Input Type: Differential
Data Interface: LVDS - Parallel, Parallel
Voltage - Supply, Analog: 3V to 3.6V
Voltage - Supply, Digital: 1.7V to 1.9V
Operating Temperature: -40°C to 85°C
Quality and Safety Features
Wide operating temperature range for harsh environments
Quality assured by Texas Instruments' standards
Compatibility
Compatible with various microcontrollers and digital interfaces
48-VFQFN Exposed Pad package for standard PCBs
Application Areas
High-speed data acquisition systems
Imaging systems
Telecommunications
Test and measurement equipment
Product Lifecycle
Active product with support for future designs
Potential for long-term availability
Several Key Reasons to Choose This Product
High data rate allows for real-time signal processing
Low voltage operation for power-sensitive applications
Versatility in interfacing with different digital systems
Robust performance in industrial temperature ranges
Backed by Texas Instruments' proven reliability and support