ADC12J2700NKE - Texas Instruments

Manufacturer Part Number

ADC12J2700NKE

Manufacturer

Texas Instruments

Introduction

The ADC12J2700NKE is a high-performance analog to digital converter (ADC) offering a 12-bit resolution and a sampling rate of up to 2.7G per second. This product is designed for data acquisition applications requiring high speed and precision.

Product Features and Performance

12-bit resolution

Sampling rate up to 2.7G samples per second

Single differential input

JESD204B data interface

Sample-and-hold (S/H) to ADC ratio of 1:1

Single A/D converter

Folding interpolating architecture

Internal reference type

Supports analog supply voltages ranging from 1.14V to 1.26V, and 1.8V to 2V

Digital supply voltages from 1.14V to 1.26V

Operating temperature range from -40°C to 85°C

Product Advantages

High-speed data acquisition capabilities

Accurate and reliable performance

Integrated JESD204B interface for easier integration into digital systems

Compact 68-VFQFN package suitable for space-constrained applications

Robust operating temperature range

Key Technical Parameters

Number of Bits: 12

Sampling Rate: 2.7G samples/sec

Number of Inputs: 1 (Differential)

Data Interface: JESD204B

Architecture: Folding Interpolating

Voltage Supply, Analog: 1.14V ~ 1.26V, 1.8V ~ 2V

Voltage Supply, Digital: 1.14V ~ 1.26V

Operating Temperature: -40°C ~ 85°C

Quality and Safety Features

Rigorous testing to ensure reliable operation under wide temperature ranges

High-quality construction for long-lasting performance

Compatibility

JESD204B interface for compatibility with a wide range of digital systems

Application Areas

High-speed data acquisition systems

Test and measurement equipment

Communication systems

Radar and satellite systems

Medical imaging

Product Lifecycle

Status: Active

This product is not nearing discontinuation, and replacements or upgrades are readily available from Texas Instruments.

Several Key Reasons to Choose This Product

Exceptionally high sampling rate for capturing fast signals accurately

High resolution for precise measurement

Integrated high-speed data interface reduces system complexity

Suitable for a wide range of high-speed applications

Reliable performance supported by Texas Instruments’ renowned quality and durability

Active product status ensures long-term availability and support