SPC560P60L3BEABR - STMicroelectronics

Manufacturer Part Number

SPC560P60L3BEABR

Manufacturer

stmicroelectronics

Introduction

The SPC560P60L3BEABR is a 32-Bit Single-Core microcontroller designed for advanced automotive applications, featuring high-speed computing capabilities and a variety of communication options.

Product Features and Performance

Core Processor: e200z0h

Core Size: 32-Bit Single-Core

Speed: 64MHz

Connectivity: CANbus, LINbus, SPI, UART/USART

Peripherals: DMA, POR, PWM, WDT

Program Memory Size: 1MB (1M x 8)

Program Memory Type: FLASH

EEPROM Size: 64K x 8

RAM Size: 80K x 8

Voltage Supply (Vcc/Vdd): 3V ~ 3.6V

Data Converters: A/D 16x10b

Oscillator Type: Internal

Operating Temperature: -40°C ~ 105°C (TA)

Product Advantages

Optimal for automotive applications with extended operating temperature range and robust connectivity options

Large program memory and RAM enhance computation and data handling

Integrated analog-to-digital converters support precise measurement applications

Key Technical Parameters

Core Size: 32-Bit

Speed: 64MHz

Program Memory: 1MB FLASH

RAM: 80K

Operating Temperature: -40°C ~ 105°C

Quality and Safety Features

AEC-Q100 Qualified

Enhanced power-on reset (POR)

Watchdog timer (WDT) for system reliability

Compatibility

Compatible with a range of automotive communication protocols including CANbus and LINbus

Supports surface mount technology for easier integration

Application Areas

Automotive control units

Automotive sensor applications

Industrial automation systems

Product Lifecycle

Status: Active

Not nearing discontinuation

Ongoing support and availability

Several Key Reasons to Choose This Product

High reliability and quality assured by AEC-Q100 qualification

Versatile connectivity options suitable for a variety of automotive applications

Robust design with a wide operating temperature range suitable for harsh environments

Ample memory resources facilitating complex control tasks and data management

Integrated safety features ensuring system stability and reliability