Manufacturer Part Number
EL7457CLZ-T7
Manufacturer
Renesas Electronics America
Introduction
The EL7457CLZ-T7 is a high-performance, quad-output MOSFET gate driver designed for power management applications, featuring independent channel configuration for both high-side and low-side drivers.
Product Features and Performance
High-side or Low-Side Driven configuration
Independent channel type for flexible control
Drives up to four N-Channel or P-Channel MOSFETS
Supply Voltage range from 4.5V to 18V
Non-inverting input type
Fast rise and fall times (13.5ns rise, 13ns fall)
Operates in temperatures ranging from -40°C to 85°C
Product Advantages
High integration with four drivers in one package maximizes board space efficiency
Compatible with both N-Channel and P-Channel MOSFETS expands utility across different applications
Key Technical Parameters
Number of Drivers: 4
Voltage Supply: 4.5V ~ 18V
Logic Voltage VIL, VIH: 0.8V, 2V
Current Peak Output (Source, Sink): 2A, 2A
Rise / Fall Time (Typ): 13.5ns, 13ns
Operating Temperature: -40°C ~ 85°C
Quality and Safety Features
Robust construction designed to withstand challenging environmental conditions within specified operating temperature range
Compatibility
Suitable for N-Channel, P-Channel MOSFETs
Surface mount design ensures compatibility with many PCB designs
Application Areas
Ideal for use in complex power management systems in industrial, automotive, and consumer electronics sectors
Product Lifecycle
Currently active status with continued manufacturer support
No indications of nearing discontinuation with available replacements or upgrades
Several Key Reasons to Choose This Product
Multi-channel configuration allows versatile use in different circuit designs
High performance with fast switching capabilities enhances overall system efficiency
Reliable operation in a wide temperature range and robust design ensures long-term durability
Surface mount form factor for easy integration in compact designs
Active product with ongoing manufacturer support ensures future compatibility and reliability