Manufacturer Part Number
72V295L10PFG
Manufacturer
Renesas Electronics America
Introduction
High-speed synchronous FIFO memory designed for high-performance data buffering applications.
Product Features and Performance
Memory Size: 2.25M (128K x 18)
Function: Synchronous
Data Rate: 100MHz
Access Time: 6.5ns
Voltage - Supply: 3 V ~ 3.6 V
Current - Supply (Max): 60mA
Uni-Directional bus direction
Depth and Width expansion
Programmable Flags support
Retransmit capability
First-Word Fall-Through (FWFT) support
Operating temperature range from 0°C to 70°C
Product Advantages
Efficient data handling and storage
Low access time enhances system speed
Robust programmable flag function for improved data management
Retransmit feature for data integrity
FWFT for improved throughput
Compatible with various systems and applications due to wide operating temperature range
Key Technical Parameters
25M memory size with 128K x 18 configuration
100MHz data rate for high-speed operations
5ns access time for quick data access
64-LQFP surface mount package for compact design
Quality and Safety Features
Reliable operation within the specified temperature range
Low power consumption with a maximum supply current of 60mA
Compatibility
Compatible with systems requiring depth and width expansion
Industry-standard 64-TQFP package ensures compatibility with standard SMT processing
Application Areas
Telecommunication
Networking
Data buffering and storage systems
High-speed computing and data processing
Product Lifecycle
Product Status: Last Time Buy indication
Upgrade or replacement solutions may be offered by the manufacturer upon discontinuation
Reasons to Choose This Product
Leading data rate of 100MHz for high-speed signal processing
Quick and reliable access time of 6.5ns suitable for timely operations
Synchronous operation ensures precise timing and control
Retransmit and FWFT features enhance data reliability and system performance
Robust construction and compatibility for a wide range of industrial uses
Manufacturer reputation for quality and reliability in the electronics sector