551SDCGI8 - Renesas Electronics America Inc

Manufacturer Part Number

551SDCGI8

Manufacturer

Renesas Electronics America

Introduction

The 551SDCGI8 is a fanout buffer specially designed for clock timing distribution. It is used to amplify and distribute clock signals within electronic circuits.

Product Features and Performance

Type: Fanout Buffer (Distribution)

Single Circuit Functionality

1:4 Input to Output Ratio

Non-Differential Input/Output Type

Supports Clock Signal Output

Maximum Frequency: 200 MHz

Operates at a Voltage Range of 1.71V to 3.465V

Usable in temperatures ranging from -40°C to 105°C

Product Advantages

High maximum operation frequency for efficient signal processing

Wide operating voltage and temperature range for versatile use in different environments

Compact surface mount package (8-SOIC) for easy integration into various electronic assemblies

Key Technical Parameters

Input: Clock

Output: Clock

Frequency Max: 200 MHz

Voltage Supply: 1.71V ~ 3.465V

Operating Temperature: -40°C ~ 105°C

Package / Case: 8-SOIC (0.154", 3.90mm Width)

Quality and Safety Features

Reliable performance within standard industrial temperature and voltage ratings

Manufactured by Renesas Electronics America, ensuring high-quality production standards

Compatibility

Designed for generic use in electronic circuits needing clock signal distribution

Compatible with surface mount technology for board level integration

Application Areas

Telecommunications

Consumer Electronics

Computing Systems

Industrial Controls

Product Lifecycle

Status: Active

Not nearing discontinuation and replacements or upgrades are currently available

Several Key Reasons to Choose This Product

High-frequency operation capability makes it ideal for complex timing solutions

Robust operational temperature and voltage range, ensuring reliability in various conditions

Compact and efficient SOIC package simplifies board-level design and manufacturing processes

Backed by Renesas Electronics America’s reputation for quality and reliability in electronic components