Manufacturer Part Number
PC28F640J3F75A
Manufacturer
micron-technology
Introduction
The PC28F640J3F75A is part of Micron Technology's StrataFlash™ series, a high-performance 64Mbit NOR FLASH memory device designed for a wide range of applications requiring non-volatile memory storage.
Product Features and Performance
Non-Volatile FLASH Memory
64Mbit Memory Size
Memory Organization: 8M x 8, 4M x 16
Parallel Memory Interface for easy integration
Write Cycle Time Word, Page: 75ns
Fast Access Time: 75 ns
Operating Voltage Range: 2.7V ~ 3.6V
Operating Temperature Range: -40°C ~ 85°C
Surface Mount Technology in a 64-TBGA package
Product Advantages
High-density integration for substantial storage
Fast write and access times for efficient data handling
Flexible voltage and temperature specifications for diverse environmental conditions
Reliable data retention and endurance
Key Technical Parameters
Memory Type: FLASH NOR
Memory Size: 64Mbit
Access Time: 75 ns
Voltage Supply: 2.7V ~ 3.6V
Operating Temperature: -40°C ~ 85°C
Quality and Safety Features
Built with Micron's advanced manufacturing processes ensuring high reliability and performance
Compatibility
Support for Parallel interface allowing easy integration into a broad range of existing systems
Application Areas
Embedded Systems
Industrial Automation
Automotive Electronics
Consumer Electronics
Telecommunications
Product Lifecycle
Obsolete: This product is now considered obsolete, indicating it may no longer be produced or supported by Micron Technology, and availability may be limited. Customers are advised to consult for replacements or upgrades.
Several Key Reasons to Choose This Product
High-density storage capacity of 64Mbit for extensive memory needs
Fast access and write cycle times facilitating efficient data management
Wide operating temperature and voltage range compatible with diverse applications
Reliable performance backed by Micron Technology's manufacturing excellence
Though obsolete, its proven performance can still be suitable for specific legacy applications where high-reliability memory storage is required