Manufacturer Part Number
MT29F16G08CBACAWP:C
Manufacturer
Micron Technology
Introduction
The MT29F16G08CBACAWP:C is a 16Gbit NAND Flash memory device offering high-density data storage in a parallel interface configuration, manufactured by Micron Technology.
Product Features and Performance
Non-Volatile FLASH Memory
High Density 16Gbit Memory Size
Organized as 2G x 8 for efficient data management
Parallel Memory Interface for rapid data transfer and access
Operates on a power supply voltage of 2.7V to 3.6V
Designed for surface mount technology (SMT) with a 48-TFSOP package
Product Advantages
Provides a substantial storage solution for embedded systems
Non-Volatile storage ensures data retention without power
Compatible with various host systems due to its parallel interface
Suitable for applications requiring quick access to large datasets
Key Technical Parameters
Memory Type: FLASH NAND
Memory Format: FLASH
Memory Size: 16Gbit
Memory Organization: 2G x 8
Voltage Supply: 2.7V ~ 3.6V
Operating Temperature: 0°C ~ 70°C (TA)
Quality and Safety Features
Manufactured by Micron Technology, known for high standards in memory quality and reliability
Designed to operate within a wide range of environmental conditions
Compatibility
Wide compatibility with host devices due to the standard parallel memory interface
Application Areas
Embedded Systems
Digital Cameras
Solid-State Drives (SSDs)
Mobile Devices
High-capacity data storage applications
Product Lifecycle
Obsolete status, indicating that it is nearing discontinuation
Users should seek information on replacements or upgrades available for future projects
Several Key Reasons to Choose This Product
High-density 16Gbit storage capability is suitable for data-intensive applications
Reliability and quality assurance from Micron Technology
Non-Volatile memory retains data without power, essential for critical applications
Surface mountable design facilitates easy integration into various device architectures
Supports a wide range of operating temperatures, ensuring performance under varying environmental conditions