Manufacturer Part Number
PIC18LF8525-I/PT
Manufacturer
Microchip Technology
Introduction
High-Performance Enhanced Flash Microcontroller with nanoWatt Technology
Product Features and Performance
8-Bit Core Processor
40MHz Maximum Speed
Embedded Microcontrollers Category
FLASH Program Memory Type
24K Words (48KB) Program Memory Size
1K x 8 EEPROM Size
8K x 8 RAM Size
69 Number of I/O
Enhanced Peripheral Interface (EBI)
Master Synchronous Serial Port (SSP) with SPI and I2C
Multiple UART/USART Modules
16-Channel, 10-Bit Analog-to-Digital Converter
Dual Capture/Compare/PWM (CCP) Modules
Enhanced Watchdog Timer (WDT)
Power-On Reset (POR)
Programmable Low-Voltage Detection (LVD)
Brown-out Reset (BOR)
Product Advantages
Robust Serial Communication Capabilities
Flexible Power Management with nanoWatt Technologies
Large Program Memory for Complex Applications
Extensive Peripheral Features for Embedded Control
In-Circuit Serial Programming™ (ICSP™)
In-Circuit Debugging Support
Key Technical Parameters
80-pin TQFP Package
0V to 5.5V Operating Voltage Range
Operating Temperature from -40°C to +85°C
Quality and Safety Features
Extended Operating Temperature Range
Save-Restore Power-Down Mode
Enhanced Flash Program Memory Endurance
Low-Power Brown-Out Reset
Compatibility
Works with MPLAB IDE and MPLAB ICD 2 In-Circuit Debugger
Compatible with Microchip's PICkit™ 3 and MPLAB PM3 for Programming
Application Areas
Industrial Control and Automation
Automotive Applications
Consumer Electronics
Telecommunication Systems
Medical Devices
Internet of Things (IoT) Nodes
Product Lifecycle
Active Product Status
Long-Term Supply Availability
No Near Discontinuation Notice
Several Key Reasons to Choose This Product
Superior Flash Endurance for Increased Reliability
High-Speed CPU for Advanced Systems
Extensive Range of Integrated Peripherals for Versatile Use
Low Power Consumption for Battery-Powered Devices
Scalable from 18 to 80 Pins for Design Flexibility
Large Community and Ecosystem Support
Development Tools Availability for Rapid Prototyping and Testing