PIC16C505-04I/P - Microchip Technology

Manufacturer Part Number

PIC16C505-04I/P

Manufacturer

Microchip Technology

Introduction

The PIC16C505-04I/P is an 8-bit microcontroller from Microchip Technology, designed for low-power and high-performance applications in embedded systems.

Product Features and Performance

Core Processor: PIC

Core Size: 8-Bit

Speed: 4MHz

Program Memory Size: 1.5KB (1K x 12)

Program Memory Type: OTP (One-Time Programmable)

RAM Size: 72 x 8

Oscillator Type: Internal

Peripherals include Power-on Reset (POR) and Watchdog Timer (WDT)

Number of I/O: 11

Operational Voltage Range: 3V to 5.5V

Operating Temperature: -40°C to 85°C

Product Advantages

Optimal for applications requiring fixed program code with overhead-free, non-volatile memory.

Low-voltage operation suitable for battery-powered systems.

Integrated watchdog timer enhancing reliability in unexpected operating conditions.

Simplified system design with internal oscillator.

Key Technical Parameters

Operating Voltage: 3V to 5.5V

Temperature Range: -40°C to 85°C

Program Memory: 1.5KB OTP

I/O Ports: 11

CPU Speed: 4MHz

Quality and Safety Features

Built-in Power-on Reset and Watchdog Timer for system stability and safety.

Robust operation in extended temperature range (-40°C to 85°C).

Compatibility

Compatible with a wide range of peripheral interfaces supported by 11 I/O ports.

Application Areas

Consumer electronics, automotive, industrial control systems, and Internet-of-Things (IoT) devices.

Product Lifecycle

Current Status: Active

No nearing discontinuation noted, ensuring long-term availability and support.

Several Key Reasons to Choose This Product

Offers a self-contained, versatile 8-bit MCU solution.

Robust temperature and voltage range suit diverse environmental conditions.

Suitable for applications requiring a fixed program with no need for future updates.

Internal oscillator reduces additional external component requirements, lowering overall system costs.

Comprehensive safety features enhance device reliability and lifetime in the field.