24LC128T-I/MS - Microchip Technology

Manufacturer Part Number

24LC128T-I/MS

Manufacturer

Microchip Technology

Introduction

The 24LC128T-I/MS is a 128Kbit EEPROM device featuring non-volatile memory with an I2C interface, ideal for applications requiring data storage and retrieval without power.

Product Features and Performance

Non-Volatile EEPROM Technology

128Kbit Memory Size

Organized as 16K x 8

I2C Memory Interface supporting a clock frequency of 400 kHz

Write Cycle Time of 5ms for both word and page

Access Time of 900 ns

Operates between 2.5V to 5.5V supply voltage

Suitable for operating temperatures from -40°C to 85°C

Surface Mount, 8-TSSOP, 8-MSOP package

Product Advantages

Durable and reliable with EEPROM non-volatile technology

Low voltage and power operation

High-speed I2C interface

Robust temperature range for versatile environmental adaptation

Key Technical Parameters

Memory Size: 128Kbit

Memory Organization: 16K x 8

Clock Frequency: 400 kHz

Write Cycle Time: 5ms

Access Time: 900 ns

Voltage Supply: 2.5V ~ 5.5V

Operating Temperature: -40°C ~ 85°C

Quality and Safety Features

EEPROM technology ensures data stability and reliability

Compliance with industrial standard voltage and temperature requirements for enhanced toughness

Compatibility

Compatible with various microcontrollers and processors supporting I2C interface

Application Areas

Industrial automation and control systems

Consumer electronics

Medical devices

Automotive systems

Telecommunications

Product Lifecycle

Currently active and in production

Not nearing discontinuation

Upgrades and replacements available as technology advances

Several Key Reasons to Choose This Product

Extensive operating temperature range suitable for rigorous environments

High-speed access and write capabilities enhancing performance in critical applications

Flexible and broad voltage supply range allowing versatility in system designs

Consistent product availability and support ensuring long-term usability

Reliable data storage integrity with non-volatile memory