Manufacturer Part Number
TS3A4742DCNR
Manufacturer
Texas Instruments
Introduction
The TS3A4742DCNR from Texas Instruments is a single-pole double-throw (SPST), normally closed (NC) analog switch specifically designed for handling low-voltage applications in a compact SOT-23-8 package.
Product Features and Performance
SPST-NC Switch Circuit
1:1 Multiplexer/Demultiplexer Circuit
Dual Circuit Configuration
Maximum On-State Resistance: 900mOhm
Channel-to-Channel Matching: 30mOhm
Supply Voltage Range: 1.6V to 3.6V
Fast Switching Times: 14ns (Ton), 9ns (Toff)
High Bandwidth: 125MHz
Low Charge Injection: 3pC
Channel Capacitance: 23pF (CS(off)), 20pF (CD(off))
Ultra-low Leakage Current: 2nA (Max)
Excellent Crosstalk Rejection: -95dB @ 1MHz
Product Advantages
Improved signal integrity due to high bandwidth and low crosstalk
Enhanced power efficiency with lower voltage supply capabilities
Minimal distortion with low channel capacitance and charge injection
Reliable performance ensured by robust temperature range operation
Key Technical Parameters
Max On-State Resistance: 900mOhm
Voltage Supply Range: 1.6V ~ 3.6V
125MHz -3dB Bandwidth
-40°C ~ 85°C Operating Temperature
SOT-23-8 Package
Quality and Safety Features
Robust operating temperature range for diverse environmental conditions
Low leakage current ensures safety in standby mode
High-quality manufacturing standards by Texas Instruments
Compatibility
Compatible with a wide range of input voltages (1.6-3.6V)
Application Areas
Telecommunications
Data Acquisition Systems
Portable Devices
Audio and Video Signal Routing
Product Lifecycle
Product Status: Active
Not nearing discontinuation with ongoing manufacturer support for replacements or upgrades
Several Key Reasons to Choose This Product
Highly efficient design for low-voltage applications
Fast switching capability improves performance in critical applications
Exceptional crosstalk and noise immunity enhances signal clarity
Compact and reliable packaging suitable for surface mount technology
Extensively tested for quality and reliability across a broad range of application conditions