TPS59116RGET - Texas Instruments

Manufacturer Part Number

TPS59116RGET

Manufacturer

Texas Instruments

Introduction

TPS59116RGET is a power management integrated circuit (PMIC) designed for DDR memory controller applications.

Product Features and Performance

Supports D-CAP™ mode for fast transient response

Wide input voltage range of 3V to 28V

Dual outputs for different voltage needs

Output voltage adjustable from 0.76V to 5.5V

Operating temperature range from -40°C to 85°C

High efficiency with low dropout

Integrated power MOSFETs

Under-voltage lockout (UVLO)

Soft start and power good function

Over temperature and over current protection

Product Advantages

Optimized for high-performance DDR applications

Enhanced power efficiency for reduced system heat

Small 24-VQFN package saves board space

Reliable operation in a wide range of environmental conditions

Key Technical Parameters

Voltage Input: 3V ~ 28V

Number of Outputs: 2

Voltage Output: 0.76V ~ 5.5V

Operating Temperature: -40°C ~ 85°C

Mounting Type: Surface Mount

Package / Case: 24-VFQFN Exposed Pad

Supplier Device Package: 24-VQFN (4x4)

Quality and Safety Features

Built-in thermal shutdown

Cycle-by-cycle overcurrent protection

UVLO for system safety

Compatibility

Versatile for use with various DDR memory controllers

Application Areas

Computer systems

Networking equipment

Embedded systems

Servers

Telecommunication devices

Product Lifecycle

Current Status: Active

Not reported as near discontinuation

Replacement or upgrade options may be available through Texas Instruments

Several Key Reasons to Choose This Product

Texas Instruments' reputation for reliable and robust power management solutions

The flexibility of dual outputs to meet various design requirements

Broad input voltage range suitable for diverse applications

Extended operating temperature range suitable for industrial use

D-CAP™ technology allows for rapid transient responses, critical for DDR memory stability

Comprehensive safety features ensure system longevity and reliability

Compact package aids in designing space-constrained applications