TLV9062QDRQ1 - Texas Instruments

Manufacturer Part Number

TLV9062QDRQ1

Manufacturer

Texas Instruments

Introduction

Dual, Low-Noise, Rail-to-Rail Input/Output Operational Amplifiers

Product Features and Performance

Dual operational amplifiers with rail-to-rail input and output

Low offset voltage of 300 μV

Low input bias current of 0.5 pA

High gain bandwidth product of 10 MHz

Slew rate of 6.5 V/μs

Wide supply voltage range from 1.8 V to 5.5 V

Total supply current of 538 μA (per channel)

Operating temperature range of -40°C to 125°C

Product Advantages

Excellent performance for low-power applications

Suitable for automotive and industrial applications

Robust design meets AEC-Q100 qualification

Key Technical Parameters

Manufacturer Part Number: TLV9062QDRQ1

Package: 8-SOIC (0.154", 3.90mm Width)

Mounting Type: Surface Mount

Number of Circuits: 2

Gain Bandwidth Product: 10 MHz

Voltage Supply Span (Min/Max): 1.8 V to 5.5 V

Current Supply: 538 μA (per channel)

Slew Rate: 6.5 V/μs

Voltage Input Offset: 300 μV

Amplifier Type: CMOS

Current Output / Channel: 50 mA

Current Input Bias: 0.5 pA

Quality and Safety Features

RoHS3 compliant

AEC-Q100 qualified for automotive applications

Compatibility

Suitable for a wide range of electronic and electrical applications

Application Areas

Automotive electronics

Industrial control systems

Portable and battery-powered devices

Sensor signal conditioning

Data acquisition systems

Product Lifecycle

This product is currently in production and actively supported by Texas Instruments.

Key Reasons to Choose This Product

Excellent performance with low offset voltage, low input bias current, and high slew rate

Wide supply voltage range and low power consumption make it suitable for battery-powered applications

Robust design meets AEC-Q100 qualification, making it suitable for automotive and industrial applications

Small 8-SOIC package and surface mount design provide flexibility for board layout and design

Texas Instruments' reputation for quality and reliability in the semiconductor industry