Manufacturer Part Number
TLC7705ID
Manufacturer
Texas Instruments
Introduction
The TLC7705ID is a power management integrated circuit (PMIC) supervisor designed for monitoring voltage levels and managing power resets within electronic systems.
Product Features and Performance
Simple Reset/Power-On Reset functionality
Monitors one voltage level
Voltage threshold set at 4.55V
Output type: Push-Pull, Totem Pole
Dual reset output for Active High and Active Low
Reset timeout: Minimum 1.1ms
Operating temperature range from -40°C to 85°C
Surface mount 8-SOIC package
Product Advantages
Provides reliable system level monitoring of power supply and brownout conditions
Flexible output configuration enhances compatibility with different logic levels
Quick reaction time through minimal reset timeout feature
Robust temperature range guaranteeing performance under varying environmental conditions
Key Technical Parameters
Voltage Threshold: 4.55V
Output: Push-Pull, Totem Pole
Reset: Active High/Active Low
Reset Timeout: 1.1ms Minimum
Operating Temperature: -40°C ~ 85°C
Quality and Safety Features
Built to operate reliably in industrial temperature ranges
Meeting stringent quality controls of Texas Instruments
Ensures system stability and prevents improper operation during extreme conditions
Compatibility
Compatible with various microcontrollers and digital systems requiring voltage supervision
Application Areas
Consumer Electronics
Automotive systems
Data communication equipment
Industrial controls
Product Lifecycle
Currently in active status with no declared discontinuation
Availability on replacements or upgrades to be consulted directly from Texas Instruments
Several Key Reasons to Choose This Product
Precision voltage monitoring for robust power management solutions
Dual output provides design flexibility for integration into numerous logic systems
Short reset timeout assures quick system recovery
High-reliability and wide temperature operation suitable for demanding applications
Backed by Texas Instruments' reputation for quality and robustness in semiconductor solutions
TLC7705ACTexas Instruments