SN74LVTH182512DGGR - Texas Instruments

Manufacturer Part Number

SN74LVTH182512DGGR

Manufacturer

texas-instruments

Introduction

The SN74LVTH182512DGGR is a specialty logic device from Texas Instruments, designed primarily for scan test applications with universal bus transceivers.

Product Features and Performance

Logic Type: ABT Scan Test Device with Universal Bus Transceivers

Operating Temperature: -40°C to 85°C

Number of Bits: 18 bits

Supply Voltage: 2.7V to 3.6V

Mounting Type: Surface Mount

Product Advantages

Optimized for voltage range flexibility

Suitable for extreme temperature environments

High bit count for comprehensive logic solutions

Key Technical Parameters

Supply Voltage: 2.7V ~ 3.6V

Operating Temperature: -40°C ~ 85°C

Number of Bits: 18

Mounting Type: Surface Mount

Package Type: 64-TFSOP (0.240", 6.10mm Width)

Quality and Safety Features

Robust surface mount package

Designed to withstand harsh environmental conditions

Compatibility

Compatible with various types of scan testing equipment and logic circuits

Application Areas

Used in development and debugging of digital systems

Ideal for telecommunications and computing systems

Product Lifecycle

Status: Active

No current indication of discontinuation or replacement

Several Key Reasons to Choose This Product

High integration with 18 bit capability enhancing design compactness

Wide operating temperature range suitable for industrial applications

Optimal supply voltage range for flexible power design

Robust packaging suitable for complex surface mount technology