SN74HC164PWR - Texas Instruments

Manufacturer Part Number

SN74HC164PWR

Manufacturer

Texas Instruments

Introduction

SN74HC164PWR is a high-performance, 8-bit serial-in/parallel-out shift register from Texas Instruments, suitable for a wide range of applications requiring data manipulation and signal processing.

Product Features and Performance

8-bit serial-in, parallel-out configuration

Push-pull output type ensures strong drive capability

Wide operating voltage range of 2V to 6V

Supports wide operating temperatures from -40°C to 125°C

Surface mount, 14-TSSOP package for compact placement

Product Advantages

Enhanced signal integrity with push-pull outputs

Versatile voltage compatibility allows use in various circuits

High-temperature resilience suitable for harsh environments

Compact footprint for space-sensitive applications

Key Technical Parameters

Number of Elements: 1

Number of Bits per Element: 8

Voltage Supply: 2V ~ 6V

Operating Temperature: -40°C ~ 125°C

Mounting Type: Surface Mount

Package / Case: 14-TSSOP

Quality and Safety Features

Robust operational performance within specified temperatures and voltage ranges

Complies with industry standards for safety and reliability

Compatibility

Compatible with multiple microcontrollers and digital systems operating within the voltage range

Application Areas

Automation systems

Signal processing

Communication devices

Consumer electronics

Data management devices

Product Lifecycle

Currently active product status

Long-term availability expected, no nearing discontinuation

Check for potential future updates or replacements from Texas Instruments

Several Key Reasons to Choose This Product

Reliable functionality from a reputable manufacturer, Texas Instruments

Capable of operating in extreme conditions making it ideal for industrial applications

Flexibility in voltage range accommodates diverse electronic setups

Compact and efficient design simplifies integration into existing systems

Ongoing product support and availability ensure long-term usability