SCANSTA112SMX - Texas Instruments

Manufacturer Part Number

SCANSTA112SMX

Manufacturer

Texas Instruments

Introduction

The SCANSTA112SMX is a specialized interface chip designed for testing equipment applications, facilitating advanced diagnostics and control through the IEEE 1149.1 standard.

Product Features and Performance

Interfaces with IEEE 1149.1 standard for test access

Supports a voltage supply range of 3V to 3.6V

Packaged in a 100-LFBGA form factor for dense circuit board layouts

Surface mount technology for efficient assembly processes

Enables complex testing strategies for electronic components

Product Advantages

Enhances test coverage and diagnostic capabilities of testing equipment

Low voltage operation minimizes power consumption

Compact package allows for integration into space-constrained designs

Designed for easy implementation in surface mount technology (SMT) assembly lines

Key Technical Parameters

Interface: IEEE 1149.1

Voltage Supply: 3V ~ 3.6V

Package / Case: 100-LFBGA

Supplier Device Package: 100-FBGA (10x10)

Mounting Type: Surface Mount

Quality and Safety Features

Manufactured by Texas Instruments, ensuring high reliability and performance standards

Complies with industry-standard quality and safety specifications for testing equipment interfaces

Compatibility

Compatible with IEEE 1149.1 compliant devices and systems, enabling versatile use across various testing setups and equipment

Application Areas

Primarily utilized in testing equipment for diagnostics and integrity verification in electronics manufacturing and repair sectors

Product Lifecycle

Noted as "Not For New Designs," indicating that the product may be nearing the end of its production cycle

Potential customers should consider the availability of replacements or upgrades for future planning

Several Key Reasons to Choose This Product

Reliable performance backed by Texas Instruments' expertise in semiconductor manufacturing

Low power consumption enhances the efficiency of testing equipment

Compact and versatile for integration into a wide range of testing and diagnostic applications

Compliance with IEEE 1149.1 ensures compatibility with standard test protocols

Attention to lifecycle stage aids in strategic planning for product development and maintenance