Manufacturer Part Number
REF3130AIDBZR
Manufacturer
Texas Instruments
Introduction
The REF3130AIDBZR is a low-noise, high-precision series voltage reference, housed in a small SOT-23-3 package, suitable for various electronic applications requiring a stable voltage source.
Product Features and Performance
Reference Type: Series
Output Type: Fixed at 3V
Noise Levels: 39µVp-p (0.1Hz to 10Hz), 57µVrms (10Hz to 10kHz)
Tolerance: ±0.2%
Temperature Coefficient: 20ppm/°C
Voltage Input: 3.05V to 5.5V
Current Output: 10 mA
Operating Temperature: -40°C to 125°C
Product Advantages
High accuracy and low tolerance ensure reliable output
Low noise output ideal for sensitive applications
Wide operating temperature range suitable for harsh environments
Low power consumption benefits battery-operated devices
Key Technical Parameters
Fixed Voltage Output: 3V
Low Output Noise: 39µVp-p and 57µVrms
Input Voltage Range: 3.05V to 5.5V
Temperature Coefficient: 20ppm/°C
Output Current: 10 mA
Quality and Safety Features
Strict tolerance levels and robust temperature coefficients ensure device reliability under varying conditions and applications.
Compatibility
Compatible with surface-mount technology for ease of integration in various circuit designs.
Packaged in standard SOT-23-3, suitable for automated assembly processes.
Application Areas
Precision voltage regulation in mixed-signal systems
Data acquisition systems
Portable and battery-powered equipment
Medical devices
Instrumentation
Product Lifecycle
Currently active
Ongoing manufacturer support with no announced discontinuation
Replacement and upgrade options available
Several Key Reasons to Choose This Product
High reliability and precision suitable for critical and high-performance applications.
SOT-23-3 package offers compact and versatile integration possibilities.
Low current supply and power efficiency optimize the performance of portable devices.
Stable performance across a wide range of operating temperatures, enhancing device robustness.
Supported by Texas Instruments' reputation and reliability in semiconductor manufacturing.
