LM393LVDR - Texas Instruments

Manufacturer Part Number

LM393LVDR

Manufacturer

Texas Instruments

Introduction

The LM393LVDR is a linear comparator from Texas Instruments, designed for a wide range of applications requiring high precision and performance.

Product Features and Performance

Dual-element general-purpose comparator

Open-drain output type

Offers propagation delay max of 600ns

Features a common mode rejection ratio (CMRR) of 65dB

Power supply rejection ratio (PSRR) of 80dB

Wide operating temperature range from -40°C to 125°C

Product Advantages

Low voltage operation from 1.65V to 5.5V suitable for battery-powered devices

Ultra-low input bias current of 5pA reduces power consumption

High output current of 100mA for driving heavier loads

Key Technical Parameters

Voltage Supply, Single/Dual (±): 1.65V ~ 5.5V

Voltage Input Offset (Max): 2mV @ 5V

Current Input Bias (Max): 5pA @ 5V

Current Output (Typ): 100mA @ 5V

Current Quiescent (Max): 35µA

CMRR, PSRR (Typ): 65dB, 80dB PSRR

Propagation Delay (Max): 600ns

Quality and Safety Features

Operates reliably within a wide temperature range of -40°C to 125°C ensuring stability in varying environments

Compatibility

Housed in an 8-SOIC package commonly used in surface mount technology, facilitating design compatibility across various PCB designs

Application Areas

Industrial electronics

Automotive systems

Consumer electronics

Data acquisition systems

Signal conditioning devices

Product Lifecycle

This product is currently listed as active, indicating ongoing production and availability. No near-term discontinuation is noted, with replacement and upgrade options readily available.

Several Key Reasons to Choose This Product

Increased design flexibility due to dual operation mode supply voltages

High power handling capabilities courtesy of a 100mA output

Extremely low input offset and bias current for accurate sensing and comparisons

Excellent temperature stability for use in harsh environments

Benefits from Texas Instruments' reputation for quality and robustness in semiconductor manufacturing