Manufacturer Part Number
INA301A2IDGKT
Manufacturer
Texas Instruments
Introduction
The INA301A2IDGKT is a current monitor device designed for power management applications, leveraging Texas Instruments' expertise in integrated circuit design.
Product Features and Performance
Integrated current shunt monitor
High/low-side sensing
Wide input voltage range: 0V to 36V
Compatible with 0.118" 8-TSSOP, 8-MSOP surface mount package
Operates within -40°C to 125°C temperature range
Offers a compact solution for current monitoring
Product Advantages
Allows for high-side and low-side current monitoring, providing flexibility in application
Wide operating voltage range makes it suitable for various power systems
Suitable for harsh environments due to its extensive operating temperature range
Compact footprint for space-sensitive applications
Key Technical Parameters
Function: Current Monitor
Sensing Method: High/Low-Side
Voltage Input: 0V ~ 36V
Operating Temperature: -40°C ~ 125°C
Mounting Type: Surface Mount
Package / Case: 8-TSSOP, 8-MSOP (0.118", 3.00mm Width)
Quality and Safety Features
Built to adhere to Texas Instruments' stringent quality control and safety standards
Compatibility
Compatibility with surface mount technologies allows for easy integration into a wide range of electronic systems
Application Areas
Power management systems
Over-current protection circuits
Battery chargers
Power supply monitoring
Product Lifecycle
Status: Active
The INA301A2IDGKT does not currently indicate nearing discontinuation, and replacements or upgrades can be expected as per Texas Instruments' product lifecycle policy.
Several Key Reasons to Choose This Product
Precision current monitoring for enhanced system performance
Flexibility in monitoring both high-side and low-side currents
Wide input voltage range suitable for a multitude of applications
Extended operating temperature range for reliability in challenging environments
Compact packaging suitable for space-constrained applications
Supported by Texas Instruments' reputation for quality and robustness in semiconductor manufacturing
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