Manufacturer Part Number
DAC3174IRGCT
Manufacturer
Texas Instruments
Introduction
The DAC3174 is a dual-channel, high-speed, 14-bit digital-to-analog converter offering excellent performance and integration for telecommunication and test equipment applications.
Product Features and Performance
14-bit resolution
Dual-channel DAC
Typical settling time of 11ns
Unbuffered current output
Support for LVDS parallel data interface
Compatible with external and internal reference types
Current source architecture
Quality performance with INL/DNL of ±2 LSB and ±1 LSB, respectively
Product Advantages
High-speed conversion enables use in demanding applications
Dual-channel operation allows for versatile signal generation
High integration reduces system complexity and BOM cost
Low power consumption is ideal for power-sensitive applications
Key Technical Parameters
Number of Bits: 14
Number of D/A Converters: 2
Settling Time: 11ns (Typical)
Output Type: Current - Unbuffered
Differential Output: Yes
Data Interface: LVDS - Parallel
Reference Type: External, Internal
Voltage - Supply, Analog: 1.71V ~ 1.89V, 3.15V ~ 3.45V
Voltage - Supply, Digital: 1.71V ~ 1.89V
Quality and Safety Features
Robust operating temperature range from -40°C to 85°C ensures reliable function across various environments
Compatibility
The device's LVDS interface ensures compatibility with high-speed digital systems
Application Areas
Telecommunications
Test and measurement equipment
Automated test equipment (ATE)
Medical imaging systems
Professional audio and video equipment
Product Lifecycle
The product status is active, indicating that it is currently being manufactured and not nearing discontinuation. Check the manufacturer's website for any updates on replacements or upgrades.
Several Key Reasons to Choose This Product
High resolution and speed for precise signal generation
Dual-channel design increases output versatility
Low power consumption increases efficiency and reduces thermal design constraints
Robust operating temperature range ensures performance in harsh conditions
Easy system integration with LVDS parallel interface and compatibility with external/internal references
Quality performance with tight INL/DNL specifications ensures accurate output signals
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