Manufacturer Part Number
ADS58C28IRGCR
Manufacturer
Texas Instruments
Introduction
High-speed, dual-channel, 11-bit analog-to-digital converter
Product Features and Performance
11-bit resolution
Dual ADC channels
200 MSPS sampling rate
Differential inputs
Simultaneous sampling
Internal reference
Pipelined architecture
LVDS and parallel data interfaces
Product Advantages
High-speed data acquisition
Precise and simultaneous signal processing
Low input-referred jitter for accuracy
Robust noise performance with internal reference
Key Technical Parameters
11-bit resolution
Sampling rate: 200 million samples per second
Input type: Differential
Number of inputs: 2
Data interface: LVDS, Parallel
Number of A/D converters: 2
Voltage supply range (Analog): 1.75V to 1.9V
Voltage supply range (Digital): 1.7V to 1.9V
Quality and Safety Features
Operational temperature range from -40°C to 85°C
Surface mount technology for reliability
Compatibility
Compatible with LVDS and parallel interface systems
Application Areas
High-speed data acquisition systems
Medical imaging equipment
Communications infrastructure
Test and measurement instruments
Product Lifecycle
Active product
Not nearing discontinuation
Replacements or upgrades are available as necessary
Several Key Reasons to Choose This Product
Rapid signal processing capability for real-time applications
Simultaneous dual-channel acquisition ensures synchronized data collection
High resolution yields detailed signal representation
Designed for a wide range of industrial temperatures
Suitable for high-performance systems requiring robust data acquisition
Stocked in Tape & Reel packaging for efficient assembly