Manufacturer Part Number
ADS5560IRGZT
Manufacturer
Texas Instruments
Introduction
High-Speed, 16-Bit, 40 MSPS Analog to Digital Converter
Product Features and Performance
16-Bit Resolution
40 MSPS Sampling Rate
Single Differential Input
Pipelined Architecture
Internal Voltage Reference
LVDS and Parallel Data Interface
Product Advantages
High Precision Conversion
High Sampling Rate for Demanding Applications
Support for Differential Signaling for Improved Noise Immunity
Integrated Reference to Simplify Design
Key Technical Parameters
Number of Bits: 16
Sampling Rate: 40 Million Samples per Second
Number of Inputs: 1
Input Type: Differential
Data Interface: LVDS - Parallel, Parallel
Configuration: Sample-and-Hold ADC
S/H:ADC Ratio: 1:1
Number of ADCs: 1
Architecture: Pipelined
Reference Type: Internal
Analog Supply Voltage: 3V to 3.6V
Digital Supply Voltage: 3V to 3.6V
Quality and Safety Features
Wide Operating Temperature Range from -40°C to 85°C
Compatibility
Surface Mount 48-VFQFN Exposed Pad Package
Compatible with Various Digital Systems via LVDS and Parallel Interfaces
Application Areas
Medical Imaging Systems
High-Speed Data Acquisition
Instrumentation
Communication Systems
Product Lifecycle
Product Status: Active
Not Nearing Discontinuation
Replacements or Upgrades Likely Available
Several Key Reasons to Choose This Product
High Precision for Critical Applications
Fast Sampling Rate Ideal for High-Speed Signal Processing
Robust Differential Input Design
Seamless Integration with Standard LVDS and Parallel Interfaces
Proven Performer in Rugged Environments due to Wide Temperature Range
Reliable Performance Backed by Texas Instruments Reputation