Manufacturer Part Number
ADS5517IRGZT
Manufacturer
Texas Instruments
Introduction
The ADS5517IRGZT is a high-performance 11-bit analog to digital converter designed for data acquisition systems.
Product Features and Performance
11-bit resolution
Sampling rate of 200M samples per second
Single differential input
Data interfaces include LVDS parallel and standard parallel
Pipelined architecture
Supports both external and internal reference types
Operates within an analog supply voltage range of 3V to 3.6V
Operates within a digital supply voltage range of 3V to 3.6V
Product Advantages
High sampling rate ideal for rapid signal processing
Flexible data interface options cater to variety of system designs
Robust pipelined architecture enhances processing speed and accuracy
Dual reference capability allows for adaptability in various applications
Key Technical Parameters
Number of Bits: 11
Sampling Rate: 200M samples per second
Number of Inputs: 1 (Differential)
Data Interface: LVDS - Parallel, Parallel
Voltage Supply, Analog: 3V to 3.6V
Voltage Supply, Digital: 3V to 3.6V
Operating Temperature: -40°C to 85°C
Quality and Safety Features
Designed for operation in extreme temperature environments from -40°C to 85°C
Compatibility
Compatible with systems requiring high-speed data acquisition and processing
Application Areas
Telecommunications
Medical Imaging
Industrial Automation
Instrumentation
Product Lifecycle
Currently active with ongoing manufacturing and support
No indication of nearing discontinuation
Replacement and upgrade options available
Several Key Reasons to Choose This Product
High-speed sampling rate ensures rapid and accurate data acquisition
Pipelined architecture ensures efficient data processing at high speeds
Flexible voltage ranges accommodate various system power designs
Support for both internal and external references increases system versatility
Built to withstand harsh operational environments, ensuring reliability and durability in industrial and critical applications
