Manufacturer Part Number
LCMXO2-4000HE-6MG132I
Manufacturer
Lattice Semiconductor
Introduction
The LCMXO2-4000HE-6MG132I is an embedded FPGA from Lattice Semiconductor's MachXO2 series, designed specifically for use in versatile electronic applications requiring a flexible and low power programmable logic solution.
Product Features and Performance
Embedded FPGA (Field Programmable Gate Array)
Surface Mount 132-LFBGA, CSPBGA Package
540 LABs/CLBs (Logic Array Blocks / Configurable Logic Blocks)
4320 Logic Elements / Cells
94208 Total RAM Bits
104 Input/Output Ports
Supports Voltage Supplies from 1.14V to 1.26V
Operating Temperature ranges from -40°C to 100°C
Packaging in a Tray
Product Advantages
High logic density enhances functionality while reducing footprint
Advanced power management for low power applications
Supports broad temperature range suitable for harsh environments
Ease of design with Lattice’s design tools suite
Key Technical Parameters
Number of LABs/CLBs: 540
Number of Logic Elements/Cells: 4320
Total RAM Bits: 94208
Number of I/O: 104
Voltage Supply: 1.14V ~ 1.26V
Operating Temperature: -40°C ~ 100°C (TJ)
Quality and Safety Features
Built with robust materials ensuring long operational life and reliability
Compliance with international safety standards for electronic products
Compatibility
Compatible with various programming and simulation software tools provided by Lattice Semiconductor
Integrates easily with a variety of peripheral components due to flexible I/O voltage levels
Application Areas
Consumer electronics
Automotive
Telecommunication systems
Industrial controls
Product Lifecycle
The product status is active
Ongoing support and updates from Lattice Semiconductor
Availability of replacements and upgrades if needed
Several Key Reasons to Choose This Product
High-performance product from a reliable FPGA series (MachXO2)
Flexible logic capacity and I/O connectivity to meet diverse application needs
Strong support and documentation available
Cost-effective solution with low power consumption
Durability in extreme temperature environments