Manufacturer Part Number
LC4256V-75T100C
Manufacturer
Lattice Semiconductor
Introduction
The LC4256V-75T100C is a highly integrated, programmable Complex Programmable Logic Device (CPLD) part of Lattice Semiconductor's ispMACH® 4000V series.
Product Features and Performance
In-system programmable logic device
Supports system integration by combining high-speed and high-density logic
Maximum delay time of 7.5 ns
Supports 3V to 3.6V internal voltage supply
Contains 16 logic elements/blocks
Features 256 macrocells and 64 I/O pins
Offered in a surface mount 100-LQFP package
Product Advantages
High integration facilitates complex designs
In-system programmability increases flexibility and reduces development time
Low delay time enhances performance in critical timing applications
Key Technical Parameters
Delay Time tpd(1) Max: 7.5 ns
Voltage Supply - Internal: 3V ~ 3.6V
Number of Logic Elements/Blocks: 16
Number of Macrocells: 256
Number of I/O: 64
Operating Temperature: 0°C ~ 90°C
Quality and Safety Features
Operates reliably within a temperature range of 0°C to 90°C
Constructed in a robust 100-LQFP package suitable for demanding environments
Compatibility
Compatible with a variety of logic design applications due to its 64 I/Os and flexible voltage requirements
Application Areas
Used in complex logic integrations across various embedded system applications such as automotive, telecommunications, and industrial controls
Product Lifecycle
This product is marked as obsolete
Replacement or upgrades may need to be sourced with newer generations or alternative products from Lattice Semiconductor or other manufacturers
Several Key Reasons to Choose This Product
Highly programmable and customizable to specific system requirements
Reduces time to market with in-system programmability
Optimal for high-performance applications requiring quick logic processing
Offers a comprehensive solution in logic designs with its multitude of logic cells and macrocells
Robust and reliable operation across various temperature ranges ensuring product durability in diverse environments