Manufacturer Part Number
EPF8820ARC208-3
Manufacturer
Intel
Introduction
The EPF8820ARC208-3 is part of the FLEX 8000 series, a range of Embedded FPGAs (Field Programmable Gate Array) designed for high-performance, programmable logic solutions.
Product Features and Performance
Incorporates 84 Logic Array Blocks (LABs)/Configurable Logic Blocks (CLBs)
Contains 672 Logic Elements/Cells
Offers 152 I/O pins for versatile interfacing
Features 8000 logic gates for complex logic circuitry
Supports a supply voltage range of 4.75V to 5.25V
Designed for surface mount technology
Operates within the temperature range of 0°C to 70°C
Product Advantages
High gate count allowing for complex programmable logic solutions
Broad range of input/output options for flexible connectivity
Robust operating temperature range suitable for various environments
Optimized for low voltage operations, enhancing power efficiency
Key Technical Parameters
Number of LABs/CLBs: 84
Number of Logic Elements/Cells: 672
Number of I/O: 152
Number of Gates: 8000
Operating Voltage: 4.75V ~ 5.25V
Operating Temperature: 0°C ~ 70°C
Quality and Safety Features
Manufactured by Intel, ensuring high-quality production standards and reliability
Compliant with industry-standard safety and quality regulations
Compatibility
Designed with a standardized 208-BFQFP exposed pad and 208-RQFP (28x28) package for compatibility with a wide range of PCB designs
Application Areas
Ideal for embedded systems, telecommunications, computing hardware, and industrial control systems
Product Lifecycle
Listed as Obsolete, indicating that it is nearing discontinuation
Users should consider seeking replacements or upgrades for new designs
Several Key Reasons to Choose This Product
High logic gate count for advanced programmable logic applications
Flexible I/O options supporting diverse connectivity needs
Low voltage operation for improved power efficiency
Robust operating temperature range, ensuring reliability in various conditions
Backed by Intel's reputation for quality and reliability in semiconductor manufacturing