Manufacturer Part Number
IS45S16400J-7TLA1
Manufacturer
Integrated Silicon Solution
Introduction
The IS45S16400J-7TLA1 is a high-performance SDRAM providing robust data management with a volatile memory type enabling quick access and processing.
Product Features and Performance
Volatile memory type best suited for quick data processing
Uses SDRAM technology, adept at enhancing the speed of data retrieval
Parallel memory interface allows high-speed data transfers
Supports a clock frequency of 143 MHz, boosting overall system responsiveness
Featuring a surface mount design, beneficial for compact and efficient device setups
Product Advantages
High transfer speeds owing to an efficient memory format and technology
Enhanced durability with operational functionality from -40°C to 85°C
Broad voltage support range from 3V to 3.6V accommodating diverse operational needs
Key Technical Parameters
Memory Type: SDRAM
Memory Size: 64Mbit
Memory Organization: 4M x 16
Clock Frequency: 143 MHz
Access Time: 5.4 ns
Voltage Supply: 3V ~ 3.6V
Operating Temperature: -40°C ~ 85°C
Quality and Safety Features
Reliable performance under extreme conditions with operating temperatures ranging from -40°C to 85°C
Meets stringent safety standards with robust packaging and quality assurance protocols
Compatibility
Compatible with varied electronics requiring parallel memory interfaces and SDRAM technology
Application Areas
Primarily used in computing systems, communication devices, and other digital applications demanding quick memory access
Product Lifecycle
Product status: Active
Not nearing discontinuation, ensuring long-term availability with support for future upgrades
Several Key Reasons to Choose This Product
High-speed performance validated by 143 MHz clock frequency and quick access time of 5.4 ns
Wide range of operating temperatures ensuring reliable performance under diverse environmental conditions
Flexible voltage supply range, which guarantees compatibility with multiple device requirements
Robust physical and operational design merging reliability with state-of-the-art memory technology