74FCT162245TPV - IDT, Integrated Device Technology Inc

Manufacturer Part Number

74FCT162245TPV

Manufacturer

Renesas Electronics America

Introduction

The 74FCT162245TPV is a high-performance, 8-bit, non-inverting transceiver with 3-state outputs. It features high-speed operation, low power consumption, and a wide operating temperature range, making it suitable for a variety of digital electronics applications.

Product Features and Performance

8-bit, non-inverting transceiver with 3-state outputs

High-speed operation with propagation delays as low as 3.5 ns

Low power consumption with supply voltage range of 4.5V to 5.5V

Wide operating temperature range of -40°C to 85°C

24 mA output drive capability in both high and low states

Product Advantages

Efficient data transmission and signal buffering

Versatile interface capabilities with various digital systems

Robust performance in demanding environments

Compact surface-mount package for space-constrained designs

Key Reasons to Choose This Product

High-speed and low-power operation for optimal system performance

Wide temperature range for use in diverse applications

Reliable 3-state outputs for flexible system integration

Compact and space-saving package design

Quality and Safety Features

Stringent manufacturing and quality control processes

Compliance with relevant safety and environmental standards

Compatibility

Compatible with 5V CMOS and 3.3V LVCMOS logic families

Interoperable with a wide range of digital system components

Application Areas

Digital electronics, communication systems, industrial automation

Computer peripherals, consumer electronics, and embedded systems

Product Lifecycle

The 74FCT162245TPV is an active and currently available product. There are no immediate plans for discontinuation, and it remains a viable solution for the target applications. Should there be any changes in the product's status or the availability of equivalent or alternative models, customers are advised to contact our website's sales team for the latest information.