MC9328MX21VK - Freescale Semiconductor

Manufacturer Part Number

MC9328MX21VK

Manufacturer

NXP Semiconductors

Introduction

The MC9328MX21VK is an embedded microprocessor from the i.MX21 series designed for mobile multimedia applications.

Product Features and Performance

Core Processor: ARM926EJ-S

Number of Cores/Bus Width: 1 Core, 32-Bit

Operating Speed: 266MHz

RAM Controllers: SDRAM

Display & Interface Controllers: Keypad, LCD

USB: USB 1.x (2 ports)

Additional Interfaces: 1-Wire, I2C, I2S, SPI, SSI, MMC/SD, UART

Operating Temperature: 0°C ~ 70°C

Voltage - I/O: 1.8V, 3.0V

Package / Case: 289-LFBGA

Product Advantages

Optimized for mobile applications with low power consumption and robust display control.

Integrated multiple communication interfaces enhance peripheral connectivity.

Key Technical Parameters

Core: ARM926EJ-S, 32-Bit

Speed: 266MHz

I/O Voltage: 1.8V, 3.0V

Temperature Range: 0°C ~ 70°C

USB Version: 1.x

Memory Support: SDRAM

Quality and Safety Features

Packaged in reliable 289-LFBGA package ensuring resilient surface mounting and durability under various temperature conditions.

Compatibility

The device interfaces well with SDRAM memory and supports a variety of communication protocols including I2C, SPI, and UART.

Application Areas

Designed for applications within mobile multimedia sectors, handheld computing devices, and other embedded systems with display requirements.

Product Lifecycle

The MC9328MX21VK is listed as Obsolete, suggesting it is nearing discontinuation with limited availability of replacements or upgrades.

Several Key Reasons to Choose This Product

Features a robust single-core ARM926EJ-S processor for reliable computing

Support for multiple interface types ensuring extensive peripheral connectivity

Low power consumption suitable for mobile and portable applications

Operates across standard commercial temperature ranges, making it versatile for different environments

Surface mounting technology in a compact 289-LFBGA package ensures minimal space utilization and enhanced device reliability