CY7B135-35JC - Cypress Semiconductor Corp

Manufacturer Part Number

CY7B135-35JC

Manufacturer

infineon-technologies

Introduction

The CY7B135-35JC is a 32Kbit Dual Port SRAM (Static Random Access Memory) device with asynchronous operation. It features high-performance with a 35ns access time and write cycle time. This SRAM is suitable for a wide range of applications that require fast, reliable data storage and retrieval.

Product Features and Performance

32Kbit Dual Port SRAM

Asynchronous SRAM with 35ns access time and write cycle time

Parallel memory interface

Operates on 4.5V to 5.5V supply voltage

Operating temperature range of 0°C to 70°C

Surface mount 52-LCC (J-Lead) package

Product Advantages

Dual port design allows for simultaneous read and write operations

High-performance with fast access and write cycle times

Low power consumption

Wide temperature range for versatile applications

Key Reasons to Choose This Product

Reliable and high-quality SRAM solution from a trusted manufacturer, Infineon Technologies

Ideal for applications requiring fast and efficient data storage and retrieval

Dual port architecture enables advanced system designs

Wide operating voltage and temperature range ensure compatibility with diverse system requirements

Quality and Safety Features

Tested and qualified to meet industry standards for reliability and performance

Robust packaging and design for long-term reliable operation

Compatibility

The CY7B135-35JC is compatible with a wide range of electronic systems and devices that require high-speed, dual-port SRAM.

Application Areas

Embedded systems

Industrial automation and control

Telecommunications equipment

Military and aerospace applications

Medical devices

Networking and communications equipment

Product Lifecycle

The CY7B135-35JC is an active product, and our website's sales team continues to manufacture and support this model. There are no immediate plans for discontinuation. Customers are advised to contact our website's sales team for information on any potential alternative or equivalent models that may become available in the future.