Manufacturer Part Number
TLE7181EMXUMA1
Manufacturer
Infineon Technologies
Introduction
Infineon's TLE7181EMXUMA1 is a PMIC gate driver designed for power management applications.
Product Features and Performance
Power Management IC (PMIC)
Gate Drivers for N-Channel MOSFETs
Half-Bridge Driver Configuration
Synchronous Channel Operation
4 Integrated Drivers
Operational Supply Voltage ranging from 7V to 34V
Supports Logic Levels of 1V (VIL) and 2V (VIH)
High Side Voltage up to 55V (Bootstrap)
Typical Rise Time of 250ns
Typical Fall Time of 200ns
Maximum Operating Temperature range from -40°C to 150°C (TJ)
Product Advantages
Integration of multiple drivers reduces component count
High-temperature operation suitable for harsh environments
Rapid switching times for improved efficiency
Support for high side bootstrap technique enables high side N-MOSFET driving
Key Technical Parameters
Channel Type: Synchronous Half-Bridge
Number of Drivers: 4
Voltage - Supply: 7V to 34V
High Side Voltage - Max (Bootstrap): 55V
Rise / Fall Time (Typ): 250ns / 200ns
Operating Temperature: -40°C to 150°C (TJ)
Mounting Type: Surface Mount
Quality and Safety Features
Operates reliably in extreme temperatures
Robust surface mount package
Designed to meet stringent industry standards
Compatibility
Compatible with N-Channel Power MOSFETs
Suitable for surface mount technology (SMT) assembly processes
Application Areas
Power Conversion
Motor Control
Power Supply Units
Automotive Applications
Industrial Automation
Product Lifecycle
Product Status: Active
Not indicated as nearing discontinuation
Alternatives or upgrades should be checked with Infineon Technologies for the latest information
Several Key Reasons to Choose This Product
Integrated half-bridge gate driving capability
High bootstrap voltage suitable for various applications
Extended operating temperature range for challenging environments
Fast switching performance for improved power efficiency
Robust LSSOP package suitable for rugged applications
Infineon's reputation for quality and reliability in the semiconductor industry