Manufacturer Part Number
CY2309SXC-1T
Manufacturer
Infineon Technologies
Introduction
The CY2309SXC-1T by Infineon Technologies is a clock generator and PLL synthesizer designed for high-performance clock distribution in digital systems.
Product Features and Performance
Fanout Buffer and Zero Delay Buffer type
Integrated PLL with Bypass option
Supports LVCMOS and LVTTL input formats
Provides 9 LVCMOS outputs
Maximum output frequency of 133.33MHz
Operates on a 3V to 3.6V supply voltage
Surface Mount 16-SOIC package
Operating temperature range from 0°C to 70°C
Product Advantages
Maintains signal integrity across multiple outputs
Flexible PLL functionality enhances system stability and performance
Compatible with common logic level standards enhancing usability
High-frequency support up to 133.33MHz suitable for modern digital applications
Key Technical Parameters
Input: LVCMOS, LVTTL
Output: LVCMOS
Ratio Input:Output: 1:9
Frequency Max: 133.33MHz
Voltage Supply: 3V ~ 3.6V
Operating Temperature: 0°C ~ 70°C
Quality and Safety Features
Strict adherence to international safety standards
Built using robust manufacturing processes ensuring high reliability and performance stability
Compatibility
Compatible with LVCMOS and LVTTL input signal standards
Usable in systems requiring multiple synchronized outputs without signal degradation
Application Areas
Telecommunications
Computing Systems
Consumer Electronics
Industrial Electronics
Product Lifecycle
Currently active and in production
No announced discontinuation, ensuring product availability for new designs and existing systems
Several Key Reasons to Choose This Product
Zero Delay Buffer feature prevents timing errors in clock distribution.
High output frequency capability supports faster data processing.
Integrated PLL with Bypass offers flexibility in system design.
Broad operating temperature range suitable for various environments.
Manufactured by Infineon Technologies, a leader in semiconductor solutions.
Multiple outputs from a single input reduce component count and design complexity.