CD4075BE - Harris Corporation

Manufacturer Part Number

CD4075BE

Manufacturer

Texas Instruments

Introduction

Triple 3-Input OR Gate IC for digital logic circuits within the 4000B series.

Product Features and Performance

Logic Type: OR Gate

Number of Circuits: 3

Independent logic gates in one package

High voltage range: 3V to 18V

Guaranteed noise margin of 1V

Maximum quiescent current: 1 µA

Output current for both High and Low states: 3.4mA

Low input logic level: 1.5V to 4V

High input logic level: 3.5V to 11V

Through Hole mounting type

Product Advantages

Wide operating voltage suitable for various applications

Low power consumption ideal for battery-powered devices

Robust operating temperature range

Standardized 14-DIP packaging for easy integration

Key Technical Parameters

Max Propagation Delay @ V, Max CL: 90ns @ 15V, 50pF

Operating Temperature: -55°C to 125°C

Supply Voltage: 3V to 18V

Voltage compatibility for TTL and CMOS logic levels

Quality and Safety Features

Lead-free and RoHS compliant

High temperature survivability

Compatibility

Compatible with other 4000 series logic components

Can interface with TTL and CMOS technologies

Application Areas

Digital electronics

Counters and timers

Alarm systems

Data processing equipment

Product Lifecycle

Active status

Not reported as near discontinuation

Availability of replacements and upgrades within TI's 4000B series logic family

Several Key Reasons to Choose This Product

Proven reliability and functionality from Texas Instruments, a leading semiconductor manufacturer

Wide voltage operation range enables use in diverse applications

Extremely low power consumption makes it eco-friendly and cost-efficient in the long run

High temperature range ensures performance in harsh conditions

Simple logic functionality for ease of use and integration

Available in bulk (Tube packaging) for mass production needs

Industry-standard PDIP-14 packaging ensures compatibility with standard PCB layouts

Sustained product lifecycle with no immediate risk of obsolescence