Manufacturer Part Number
AT24C256N-10SQ-2.7
Manufacturer
Atmel
Introduction
High-density 256Kbit EEPROM for reliable non-volatile memory storage
Product Features and Performance
256Kbit of non-volatile memory storage
I2C compatible interface
High-speed data access with 400 kHz clock frequency
Write cycle time of 5ms for quick data storage
900 ns access time for rapid data retrieval
Wide voltage supply range between 2.7V to 5.5V
Capable of operating under extreme temperatures ranging from -40°C to 125°C
Surface mount 8-SOIC package for PCB integration
Product Advantages
Large storage capacity in a compact form factor
Durable and reliable through extreme temperature ranges
Broad compatibility with various microcontroller interfaces
Long-term data retention capabilities
Low power consumption aiding in battery-powered device longevity
Key Technical Parameters
Memory Type: EEPROM
Memory Size: 256Kbit
Memory Organization: 32K x 8
Clock Frequency: 400 kHz
Write Cycle Time: 5ms
Access Time: 900 ns
Voltage Supply: 2.7V ~ 5.5V
Quality and Safety Features
High endurance and data retention rates
Robust error detection and correction algorithms
Designed for high-reliability applications
Compatibility
Compatible with any I2C interface supporting 400 kHz operation
Adaptable for use with various microcontrollers and processors
Application Areas
Data storage for industrial automation
Configuration settings for consumer electronics
Parameter storage for automotive systems
Medical device memory applications
Product Lifecycle
Currently active product with continuous manufacturer support
Not close to discontinuation, with replacements or upgrades readily available
Several Key Reasons to Choose This Product
Vastly adaptable across a range of applications and industries
Stable operation across extensive temperature conditions
Flexible voltage range accommodating different designs
Ample data storage for complex or data-intensive operations
High transmission speeds ensuring efficient operations
Strong manufacturer support ensuring product reliability and availability