MAX5180BEEI+ - Analog Devices Inc./Maxim Integrated

Manufacturer Part Number

MAX5180BEEI+

Manufacturer

analog-devices

Introduction

The MAX5180BEEI+ is a high-performance digital-to-analog converter (DAC) from Analog Devices, designed for precise data acquisition applications.

Product Features and Performance

Dual 10-bit DACs

Fast settling time of 25ns

Current source output architecture

Supports both external and internal reference types

Differential output capability

Parallel data interface

Product Advantages

High precision with INL/DNL of ±0.5 LSB

Fast response ideal for high-speed applications

Flexible reference voltage options enhancing adaptability

Minimal cross-talk through differential outputs

Key Technical Parameters

Number of Bits: 10

Number of D/A Converters: 2

Settling Time: 25ns

Output Type: Current Unbuffered

Differential Output: Yes

Data Interface: Parallel

Reference Type: External, Internal

Voltage Supply, Analog: 2.7V ~ 3.3V

Voltage Supply, Digital: 2.7V ~ 3.3V

INL/DNL (LSB): ±0.5, ±0.5

Operating Temperature: -40°C ~ 85°C

Quality and Safety Features

Robust operation within a wide temperature range of -40°C to 85°C

Reliable performance with tight INL/DNL specifications

Compatibility

Compatible with systems requiring parallel data inputs

Suitable for various reference voltage requirements due to dual reference type support

Application Areas

Telecommunications

Signal processing

Automated test equipment

Portable battery-powered devices

Product Lifecycle

Status: Active

No current indications of discontinuation

Ready availability of replacements and upgrades

Several Key Reasons to Choose This Product

Dual DAC feature supports complex signal generation

Exceptionally fast settling time increases throughput for high-speed applications

Flexibility in using either internal or external references enhances adaptability to different system designs

Robust performance in extreme environments due to wide operating temperature range

Precision output with low integral and differential nonlinearity errors boosts accuracy in critical applications