MAX4053CSE - Analog Devices Inc./Maxim Integrated

Manufacturer Part Number

MAX4053CSE

Manufacturer

Analog Devices

Introduction

The MAX4053CSE is a high-performance analog switch designed for signal routing in various applications.

Product Features and Performance

SPDT switch circuit configuration

2:1 multiplexer/demultiplexer circuit

Includes three independent circuits

On-state resistance maximum of 100 Ohm

Channel-to-channel matching up to 12 Ohm (Max)

Supports wide supply voltage range from 2V to 16V or ±2.7V to 8V dual supply

Fast switching times with maximum of 175ns for turn-on and 150ns for turn-off

Low charge injection of 2pC

Channel capacitance of 2pF when switched off

Extremely low leakage current, maximum of 1nA

High crosstalk isolation of -90dB at 100kHz

Product Advantages

Low power consumption

Fast response time

Precision signal routing with minimal signal distortion

Compact 16-SOIC surface mount package

Key Technical Parameters

On-State Resistance (Max): 100Ohm

Channel-to-Channel Matching (ΔRon): 12Ohm (Max)

Voltage - Supply, Single (V+): 2V ~ 16V

Voltage - Supply, Dual (V±): ±2.7V ~ 8V

Switch Time (Ton, Toff) (Max): 175ns, 150ns

Charge Injection: 2pC

Channel Capacitance (CS(off), CD(off)): 2pF, 2pF

Current - Leakage (IS(off)) (Max): 1nA

Quality and Safety Features

Designed and built to avoid overheating and malfunction under standard operating temperatures ranging from 0°C ~ 70°C (TA)

Compatibility

Compatible with various digital and analog signal applications

Application Areas

Telecommunications

Data acquisition systems

Test equipment

Audio and video switching

Product Lifecycle

This product is now Obsolete, suggest looking for newer models or replacements

Several Key Reasons to Choose This Product

Highly reliable with low fault rates

Supports wide range of power supply options

Minimal signal interference allows for precise applications

Quick and efficient switching capability ideal for high-speed applications

Optimized for low power consumption, extending overall device longevity