NCP706AMX300TAG - onsemi

Manufacturer Part Number

NCP706AMX300TAG

Manufacturer

onsemi

Introduction

The NCP706AMX300TAG is a low-dropout linear voltage regulator from onsemi, suitable for power-sensitive applications requiring a stable output voltage.

Product Features and Performance

Positive output configuration with a fixed output voltage of 3V

Capable of outputting 1A current

Very low dropout voltage of only 0.23V at 1A load

Low quiescent current of 230 µA

High PSRR of 65dB to 52dB across frequencies from 100Hz to 10kHz

Built-in control features such as enable function for better power management

Robust protection features including over current, over temperature, soft start, and UVLO

Product Advantages

Stable and reliable performance in various conditions due to high PSRR and low dropout voltage

Enhanced protection mechanisms ensure long-term reliability and safety under different operational stress

Low quiescent current advantageous for power-sensitive applications

Key Technical Parameters

Output Voltage (Min/Fixed): 3V

Current Output: 1A

Voltage Dropout (Max): 0.23V @ 1A

Current Quiescent: 230 µA

PSRR: 65dB ~ 52dB (100Hz ~ 10kHz)

Quality and Safety Features

Features over current, over temperature, soft start, and under voltage lockout (UVLO)

Operating temperature range from -40°C to 125°C

Compatibility

Surface Mount, 8-XFDFN Exposed Pad, 8-XDFN (1.6x1.2) package accommodates compact board designs

Application Areas

Particularly useful in battery-operated devices, IoT devices, and other portable electronic applications where power efficiency is critical

Product Lifecycle

Currently marked as Obsolete

Customers should seek replacements or consider upgrades due to discontinuation

Several Key Reasons to Choose This Product

Very low dropout voltage ensures efficient use even at low differences between input and output voltage

High PSRR offers stability across different frequencies beneficial for noise-sensitive applications

Comprehensive protection features ensure operational safety and device integrity under adverse conditions