Manufacturer Part Number
CAT25320YI-GT3
Manufacturer
onsemi
Introduction
The CAT25320YI-GT3 is a 32Kbit non-volatile EEPROM memory chip, employing EEPROM technology, designed for efficient data storage and retrieval in a wide range of applications.
Product Features and Performance
Non-Volatile EEPROM Memory
Memory Size: 32Kbit
Memory Format: EEPROM
Memory Organization: 4K x 8
Memory Interface: SPI
Clock Frequency: 10 MHz
Write Cycle Time - Word, Page: 5ms
Voltage Supply Range: 1.8V to 5.5V
Operating Temperature Range: -40°C to 85°C
Mounting Type: Surface Mount
Package: 8-TSSOP (0.173", 4.40mm Width)
Product Advantages
Robust data retention and high endurance.
Wide voltage supply range compatible with various logic levels.
High-speed SPI interface ensures swift data communication.
Compact 8-TSSOP package saves board space.
Key Technical Parameters
Memory Size: 32Kbit
SPI Memory Interface
Clock Frequency: 10 MHz
Voltage - Supply: 1.8V ~ 5.5V
Operating Temperature: -40°C ~ 85°C
Quality and Safety Features
Designed for reliable data storage in harsh environments.
Complies with stringent quality and safety standards.
Compatibility
Compatible with a broad range of microcontrollers and processors through the SPI interface.
Flexible voltage compatibility for systems with different logic levels.
Application Areas
Embedded Systems
Consumer Electronics
Automotive Electronics
Industrial Control Systems
Telecommunications Equipment
Product Lifecycle
Status: Active
The product is currently active with no indication of discontinuation, ensuring long-term availability.
Several Key Reasons to Choose This Product
High memory capacity (32Kbit) in a small form factor (8-TSSOP).
Support for a wide range of operating temperatures (-40°C to 85°C) suitable for demanding environments.
Flexible power supply range (1.8V to 5.5V) accommodates various application requirements.
Fast data transmission capability with a 10 MHz SPI interface enhances performance in data-intensive applications.
The product is backed by onsemi’s reputation for quality and reliability in semiconductor manufacturing.