ADP165AUJZ-3.0-R7 - Analog Devices Inc.

Manufacturer Part Number

ADP165AUJZ-3.0-R7

Manufacturer

Analog Devices

Introduction

The ADP165AUJZ-3.0-R7 is a highly efficient Linear Low-Dropout Regulator designed to maintain high performance in power management applications.

Product Features and Performance

Positive output configuration

Fixed output type

Capable of handling input voltage up to 5.5V

Provides a stable 3V output

Maximum voltage dropout of 0.225V at 150mA load

Low quiescent current of 2.4 µA

Maximum supply current of 6.2 µA

Features enable control for on/off functionality

Incorporates protection against overcurrent, overtemperature, and undervoltage lockout (UVLO).

Product Advantages

High reliability and consistency in performance

Minimal power loss due to low dropout voltage

Extended battery life enabled by low quiescent current

Robust protection features enhance device longevity and safety

Key Technical Parameters

Voltage - Input (Max): 5.5V

Voltage - Output (Min/Fixed): 3V

Current - Output: 150mA

Voltage Dropout (Max): 0.225V @ 150mA

Current - Quiescent (Iq): 2.4 µA

Current - Supply (Max): 6.2 µA

Quality and Safety Features

Overcurrent protection

Overtemperature protection

Under Voltage Lockout (UVLO)

Operates within a temperature range of -40°C to 125°C

Compatibility

Compatible with surface mount technology

Fits in SOT-23-5 Thin, TSOT-23-5 package types

Application Areas

Ideal for battery-powered devices

Suitable for portable and wireless devices

Used in consumer electronics

Applicable in power-sensitive applications

Product Lifecycle

Status: Active

Not nearing discontinuation and replacements or upgrades should be readily available

Several Key Reasons to Choose This Product

Ensures minimal energy dissipation due to low dropout feature

Improves battery efficiency through reduced quiescent current

Highly reliable under various temperature conditions and protection mechanisms

Easy integration into various designs due to compact SOT-23-5 package

Reduces risk of device failure with robust safety features