Manufacturer Part Number
AD8564ARZ-REEL7
Manufacturer
Analog Devices
Introduction
AD8564ARZ-REEL7 is a high-performance linear comparator designed for precision operation across various applications.
Product Features and Performance
General purpose linear comparator
Contains four independent comparator elements
Output compatible with CMOS and TTL logic levels
Maximum propagation delay of 9.8ns ensures quick response
Excellent Common Mode Rejection Ratio (CMRR) of 85dB
Power Supply Rejection Ratio (PSRR) of 80dB enhances stability
Product Advantages
High-speed operation suitable for rapid signal processing
Multi-element configuration allows handling of multiple signals simultaneously
Low input offset and bias current enhance accuracy in signal comparison
Key Technical Parameters
Number of Elements: 4
Voltage - Input Offset (Max): 7mV @ 5V
Current - Input Bias (Max): 4µA @ 5V
Current - Quiescent (Max): 14mA each independently, 7mA combined
Propagation Delay (Max): 9.8ns
Operating Temperature: -40°C to 85°C
Quality and Safety Features
Built to operate reliably within a wide temperature range of -40°C to 85°C
Robust CMOS and TTL output compatibility ensures safe interfacing with other digital devices
Compatibility
Output compatible with both CMOS and TTL logic levels
Application Areas
Timing circuits
Level shifting circuits
Peak detectors
Window comparators
Analog-to-digital converters
Process control systems
Product Lifecycle
Active product status
Check with manufacturer for any updates regarding discontinuation or availability of upgrades
Several Key Reasons to Choose This Product
Ultra-fast response time facilitates rapid system response to changing conditions
Four independent comparator elements allow for versatile usage in complex electronics
High CMRR and PSRR values ensure reliable performance in noisy environments
Low power consumption combined with high output drive capability
Compatible with a wide range of other digital ICs due to CMOS and TTL output levels
Suitable for operation in challenging temperature conditions, enhancing system reliability